IPFW Wireless Technology Center

2013 Nonlinear Measurement Workshop,

Wireless Technology Center

Indiana-Purdue University Fort Wayne, Indiana

Workshop Schedule:

Wednesday, May 29, 2013

0)    8:30 am to 9 am, coffee and snacks

1)    9:00 am to 10:15 am

A) Background: Basics of Microwave Amplifier Design and Measurements. S-Parameters for linear and S-Functions to include both linear and nonlinear properties of devices and systems.

2)    10:15-10:30 coffee and snack break

3)    10:30 am to 12:00 pm

B) What to Expect: Different types of nonlinear measurement systems; what is needed for each and approximate cost: main equipment and specifications, accessory equipment and parts, dollars, time for setup and parts acquisition, time for learning and time for measurements; “unexpected” needs, such as specific test fixtures and calibration fixtures.

4)    12:00 to 12:45 Lunch (provided)

5)    12:45 to 2:15 Using the software:

C) ICE for Vector Loadpull and RF data analysis. Each individual participant will learn how to set up the system for real time vector load pull and will analyze load pull data already taken. The system stores extensive RF data at each point [can be thousands of points] of loadpull and users will learn how to view and use this data, including waveform analysis.

6)    2:15 to 2:25: snacks

7)    2:25 to 3:25 Using the Software:

D) RF Measurements and Setting up for S-Function Extraction. Since there are thousands of things that could be measured and some of them will have destructive results or create a file that is too large to use in a simulator, datasets need to be chosen carefully. Before deciding which parameters to create S Functions for, DC and RF initial measurements need to be taken as the basis for safe and effective data point selection.

8)    3:30 to 5:00, in the lab.

E) Preparing Your Microwave Device for Test: Setting up system in preparation for VNA calibration in ICE, especially the frequency grid; [Tuners take too long for calibration, so they will be calibrated in advance of workshop.] Calibration of VNA in ICE;  Testing system to make sure bias is correct; Connecting device to be tested; Making sure device DC characteristics are OK; Initial RF testing to determine conditions for S Function Extraction; Saving setup.

9)    5:00 to 5:45 pm: Reception and snacks

Thursday, May 30, 2013:

0)    8:30 am to 9 am, coffee and snacks

1)    9:00 am to 10:15 am

D) RF Measurements [manually adjusted]: It is important make sure device is working properly and to verify limits of measurement that will give needed data but not damage the device. [For example, “probe” your system for potential instabilities.]

2)    10:15-10:30am coffee and snack break

3)    10:30 am to 11:30 am

E) Simple Automated Measurements: The loadpull software module allows automated vector measurements and recording/storage of all RF data for later use. It is also a quick way “preview” the type of measurements you would do for S function extraction.

4)    11:30am to 1:00pm

F) S Function Extraction: Both “Loadpull” and “S-Function Extraction” are applications within the ICE software and are set up in a similar way as a sweep of selected settings. Much of the resultant data is the same or similar except in how it is presented. The loadpull information is “indexed” by points on the Smith Chart and the S-Function data can be saved as S-Functions. The internal graphical data from S-Functions can be shown as plots quite similar to S-Parameters, but with many more options, and can also be used for simulation and modeling within other software, such as Agilent ADS. For example, using DC bias and 3 harmonics, the familiar set of 4 S-Parameters expends to a set of 96 S-Functions.

5)    1:00 to 1:45 Lunch (provided)

6)    2:00 and beyond. Lab and equipment will be available for continued use for those who can stay longer.

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